· M Braun / Unialb Pro SP
(1500/780)
· Battery fabrication
· Agilent Technologies /
for CARY 5000
· Optical property
· DaeHeung Science
· Heat Treatment
· Keithley 2400
· Solar Cell IV analysis
· Veeco / D3100
· Surfaces analysis
· Resonant Technologies
GmbH / RT2005
· Biosensing; Optical
property
· Varian Technologies /
CARY 5000
· Optical property
· Perkin Elmer / LS55
· Fluorescence property
· Autolab / AUT302N
· Electrochemistry
· McScience / Polaronix
K3000
· Solar cell evaluation
· Femto Science Inc. /
Covance-1MPV-RF
· Surface treatment;
cleaning
· MTI Corporation / PTL-NMB · Thin film fabrication
· EPLEX / SPIN-1200D
· Thin film fabrication
· UVP / XX-15 Bench & Lamp
(λ = 254 nm)
· Polymer degradation/
crosslinking
· Hanil Science Industrial /
HM-150V
· Separation
· Newport / MODEL 66984
(300W Xe; Cut-on 420nm filter)
· Photocatalysis
· Mini-Mite / TF55035C ;
CELERITY / TN-280
· CVD & PVD
· IVIUM Technologies /
IVIUMSTAT.XR
· Potentiostat/Galvanostat
/Impedance
· Ajeon Heating Industrial
Co., Ltd / Service Temp.
~1200 ℃; Vacuum; Inert
Atmosphere; Water
Cooling
· CVD & PVD ; Carbonization
· JEIO Tech / OV-11
(Two Sets)
· Thermal annealing; Drying
· KD Scientific / KDS LEGATO
200
· Microfluic device
fabrication; QD synthesis
· Nikon / Eclipse LV100D
· Microscopic morphology
analysis
· Sungwoo Co. / VC-100
· Carbon coating
· Hanil Science Industrial
/ Combi-514R
· Separation
· GHARI VACUUM TECH. Inc /
GVGB-1200 Solar cell
· fabrication
· GHARI VACUUM TECH. Inc /
7200-1206
· IVIUM Technologies
· IMPS / IMVS measurement
· WonATech / WBCS3000
· Charge / Discharge
Battery performance test
· Shimadzu / GC-2014
· Gas chromatograph
· OMA 450W, CLASS AAA
system
· Solar cell evaluation
· L-4LC/365 nm, 254 nm
· Fluorescence observation
· HS technology
· IPCE (Incident photo-to-
current efficiency)
measurement
· JEOL / JSM-2100F
· Nanostructure analysis
· JEOL / JSM-6700F
· Nanostructure analysis
· Midas System Co., Ltd /
MDA-400M
· Nano-patterning; E-beam
lithography
· Oxford NMR / FT-NMR
AS500
· Chemical analysis
· Bruker / SMART APEX
System
· Analysis of crystal
structure
· EPLEX / SPIN-1200D
· Analysis of crystal
structure
· FTIR : Bruker / INVENIO-R
· Structural analysis
· Varian / CP-3800
· Molecular weight
measurement
· Micromeritics / ASAP2020
· Surface area and porosity
analysis